Electrical and Computer Engineering 534:

Materials Characterization (4.0 units)

Characterization of solid structure by X-ray diffraction, electron microscopy, atomic force and tunneling microscopy and elemental analysis by photoemission, X-ray fluorescence, Auger, energy loss spectroscopies.
  • Crosslist: This course is offered by the MASC department but may qualify for major credit in EE. To register, enroll in MASC 534.
SectionSessionTypeTimeDaysRegisteredInstructorLocationSyllabusInfo
32177R048Lecture2:00-3:50pmTue, Thu6 of 40Anupam MadhukarVHE217session dates
Information accurate as of January 19, 2024 5:02 pm.