Computer Science 658:
Diagnosis and Design of Reliable Digital Systems (3.0 units)
Fault models; test generation; fault simulation; self-checking and self-testing circuits; design for testability; fault tolerant design techniques; case studies.
- Restriction: Registration open to the following class level(s): Master Student, Doctoral Student
- Crosslist: This course is offered by the EE department but may qualify for major credit in CSCI. To register, enroll in EE 658.
| Section | Session | Type | Time | Days | Registered | Instructor | Location | Syllabus | Info |
|---|---|---|---|---|---|---|---|---|---|
| 30787R | 048 | Lecture | 8:00-10:50am | Saturday | 52 of 76 | Moe Tabar | OHE136 |  | |
| 30788D | 034 | Lecture | 8:00-10:50am | Saturday | 3 of 20 | Moe Tabar | DEN@Viterbi | |