Materials Science 534:

Materials Characterization (4.0 units)

Characterization of solid structure by X-ray diffraction, electron microscopy, atomic force and tunneling microscopy and elemental analysis by photoemission, X-ray fluorescence, Auger, energy loss spectroscopies.
    SectionSessionTypeTimeDaysRegisteredInstructorLocationSyllabusInfo
    32177R048Lecture2:00-3:20pmTue, Thu7 of 40Anupam MadhukarONLINEPDF (1032250 MB)session dates
    Information accurate as of February 7, 2022 7:48 am.