Computer Science 658:
Diagnosis and Design of Reliable Digital Systems (3.0 units)
Fault models; test generation; fault simulation; self-checking and self-testing circuits; design for testability; fault tolerant design techniques; case studies.
- Restriction: Registration open to the following class level(s): Master Student, Doctoral Student
- Crosslist: This course is offered by the EE department but may qualify for major credit in CSCI. To register, enroll in EE 658.
|30787R||048||Lecture||5:30-8:20pm||Monday||22 of 60||Moe Tabar||LVL17|