Computer Science 658:

Diagnosis and Design of Reliable Digital Systems (3.0 units)

Fault models; test generation; fault simulation; self-checking and self-testing circuits; design for testability; fault tolerant design techniques; case studies.
  • Restriction: Registration open to the following class level(s): Master Student, Doctoral Student
  • Crosslist: This course is offered by the EE department but may qualify for major credit in CSCI. To register, enroll in EE 658.
SectionSessionTypeTimeDaysRegisteredInstructorLocationSyllabusInfo
30787R048Lecture5:30-8:20pmMonday22 of 60Moe TabarLVL17session dates
Information accurate as of February 7, 2022 7:48 am.