Materials Characterization (3.0 units)
Characterization of solids by optical microscopy, electron microscopy, (TEM, SEM) and elemental and structural analysis (EPMA, ESCA, AES, SIMS, HEED, LEED, SED, etc.).
32177D | 048 | Lecture | 2:00-3:20pm | Tue, Thu | 11 of 40 | Anupam Madhukar | KDC236 | | |
Information accurate as of October 10, 2019 11:02 am.