Electrical and Computer Engineering 534:
Materials Characterization (3.0 units)
Characterization of solids by optical microscopy, electron microscopy, (TEM, SEM) and elemental and structural analysis (EPMA, ESCA, AES, SIMS, HEED, LEED, SED, etc.).
- Crosslist: This course is offered by the MASC department but may qualify for major credit in EE. To register, enroll in MASC 534.
| Section | Session | Type | Time | Days | Registered | Instructor | Location | Syllabus | Info |
|---|---|---|---|---|---|---|---|---|---|
| 32177D | 048 | Lecture | 2:00-3:20pm | Tue, Thu | 11 of 40 | Anupam Madhukar | KDC236 |   |