Materials Characterization (3.0 units)
Characterization of solids by optical microscopy, electron microscopy, (TEM, SEM) and elemental and structural analysis (EPMA, ESCA, AES, SIMS, HEED, LEED, SED, etc.).
32177R | 048 | Lecture | 3:30-4:50pm | Tue, Thu | 21 of 41 | Anupam Madhukar | VHE217 | |   |
Information accurate as of October 27, 2016 5:33 pm.