Materials Science 534:

Materials Characterization (3.0 units)

Characterization of solids by optical microscopy, electron microscopy, (TEM, SEM) and elemental and structural analysis (EPMA, ESCA, AES, SIMS, HEED, LEED, SED, etc.).
    SectionSessionTypeTimeDaysRegisteredInstructorLocationSyllabusInfo
    32177R048Lecture3:30-4:50pmTue, Thu21 of 30Anupam MadhukarVHE217feesession dates
    Information accurate as of 1/27/2016 10:27 AM.