Computer Science 658:

Diagnosis and Design of Reliable Digital Systems (3.0 units)

Fault models; test generation; fault simulation; self-checking and self-testing circuits; design for testability; fault tolerant design techniques; case studies.
  • Restriction: Registration open to the following class level(s): Master Student, Doctoral Student
  • Crosslist: This course is offered by the EE department but may qualify for major credit in CSCI. To register, enroll in EE 658.
SectionSessionTypeTimeDaysRegisteredInstructorLocationSyllabusInfo
30787D048Lecture6:30-9:20pmWednesday64 of 80Mohamm Mirza Aghatabar AhangarOHE132feesession dates
31144D034Lecture6:30-9:20pmWednesday0 of 20Mohamm Mirza Aghatabar AhangarDEN@Viterbifeesession dates
Information accurate as of 1/27/2016 9:24 AM.