Computer Science 658:

Diagnosis and Design of Reliable Digital Systems (3.0 units)

Fault models; test generation; fault simulation; self-checking and self-testing circuits; design for testability; fault tolerant design techniques; case studies.
  • Restriction: Registration open to the following class level(s): Master Student, Doctoral Student
  • Crosslist: This course is offered by the EE department but may qualify for major credit in CSCI. To register, enroll in EE 658.
SectionSessionTypeTimeDaysRegisteredInstructorLocationSyllabusInfo
30671D048Lecture3:30-6:20pmWednesday51 of 60Mohamm Mirza Aghatabar AhangarVKC156feesession datesbook list
30787D048Lecture6:30-9:20pmWednesday49 of 60Mohamm Mirza Aghatabar AhangarZHS252feesession datesbook list
30911D034Lecture12:30-1:50pmMon, Wed
Canceled
feesession datesbook list
Information accurate as of 9/23/2014 4:03 PM.